2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope

Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope

IXRF EDS detector included

DOM: 2018

High resolution imaging in HV/LV/SE/BSE

Zeromag-mode for intuitive transition from light-optic to SEM image

Chemical analysis with integrated EDS and live analysis

Multi-touch screen control and wireless operation

Automatic SEM condition setup based on sample type

Simultaneous multiple live image and movie capture

Fast sample navigation at 5x – 300,000x magnifications

Smile View Premium with image sharpening, montaging, position alignment and overlay

Compact floor space: ca. 0,5m²

Specifications Resolution:

High Vacuum mode: 3nm (30kV)*, 4nm (20kV), 8nm (3kV), 15nm (1kV)

Low Vacuum mode: 4nm (30kV)*, 5nm (20kV) BSE

Accelerating voltage: 0,5 -30 kV

Magnification: x5 to x300,000 (Polaroid reference)

LV detector:

Multi-segment BSED (std.)

LV-SED (option)

LV pressure: 10 ∼ 100 Pa

Maximum specimen size:

Observation：125mm diameter

Loadable：152mm

Height：50mm

LGS type stage:

Eucentric goniometer

X=80mm (motorized), Y=40mm (motorized), Z=5mm-48mm

R=360° (endless)

Tilt -10/+90° / (optional: 3- or 5-axis motor drive)

Frame Store: Up to 5120×3840 pixels